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Fei Introduces Hardware and Software Upgrades For Tecnai(TM) G2 TEM

New Operating Software, and Inspect3D Xpress Advance Tecnai's Fully Embedded Operation and Fast Time to Smart Data

HILLSBORO, Ore., Aug. 1 /PRNewswire-FirstCall/ -- FEI released new software and hardware for its market-leading Tecnai(TM) G2 transmission electron microscope (TEM) at Microscopy and Microanalysis 2005 Conference today in Honolulu. The new software (Tecnai 3.0) delivers enhanced ease of operation of the Tecnai TEM and ensures full benefit of the system's leading- edge performance. The new hardware features an innovative computer-based technology, Inspect3D Xpress, for unprecedented speed with 3D image reconstruction.

The new Tecnai 3.0 operating software takes full digital control of the microscope and all detectors to the next level. Running under WindowsXP, the new software enhances overall system stability and performance, further boosting the Tecnai's ease of operation and decreased time to highest quality data. It includes a new version of TEM Imaging and Analysis software (TIA) with enhanced image and data processing functionality. The software now supports and embeds a wider scope of third-party CCD cameras.

The new Inspect3D Xpress is an all-new tomography reconstruction package that dramatically speeds quality realignment and 3D reconstruction techniques. This revolutionary product utilizes the latest computer technology to enhance image reconstruction speeds by a factor of 100x, achieving an industry milestone in high resolution 3D imaging.

"These software and accessory advances continue the Tecnai's promise of fast time to smart data and full system integration for greater productivity," said Vahe Sarkissian, FEI's CEO and Chairman. "Together, the Tecnai and our newly released Titan(TM) (S)TEM represent the most powerful solutions for ultra-high resolution electron microscopy for users working in NanoResearch, NanoBiology and NanoElectronics."

FEI's award-winning Tecnai G2 TEM remains an industry-standard for advanced ultra-high resolution electron microscopy with more than 500 Tecnai TEMs installed worldwide since 1998. The Tecnai's philosophy of fast time to smart data with proprietary applications software results in high productivity without compromising quality of results, making it ideal for every application and every market. It is currently the only all-digital transmission electron microscope system on the market and is the commercial platform that first achieved sub-Angstrom imaging (at 200kV) and analysis resolution (0.1eV at 200kV).

FEI will also feature its recently-released Nova NanoSEM and its line of industry-leading DualBeam(TM) (focused ion beam/scanning electron microscope) systems at this year's Microscopy and Microanalysis conference where more than 1,600 individuals are expected to will have an opportunity to see the latest developments from FEI and attend technical presentations from FEI scientists and customers.

About FEI

FEI's Tools for Nanotech(TM), featuring focused ion-and electron-beam technologies, deliver 3D characterization, analysis and modification capabilities with resolution down to the sub-Angstrom level. With R&D centers in North America and Europe and sales and service operations in more than 40 countries around the world, FEI is bringing the nanoscale within the grasp of leading researchers and manufacturers and helping to turn some of the biggest ideas of this century into reality. More information can be found on the FEI website at: http://www.feicompany.com .

This news release contains forward-looking statements that include statements about new product capability and performance. Factors that could affect these forward-looking statements include but are not limited to, the inability of FEI to successfully implement the improvements described in its tools to achieve the forecasted performance. Please also refer to our Form 10-K, Forms 10-Q and other filings with the U.S. Securities and Exchange Commission for additional information on these factors and other factors that could cause actual results to differ materially from the forward-looking statements. FEI assumes no duty to update forward-looking statements.

SOURCE FEI Company
08/01/2005
CONTACT: Dan Zenka, APR, Director, Worldwide Public Relations for FEI Company/Corporate Headquarters, +1-503-726-2695, or dzenka@feico.com

Web site: http://www.feicompany.com
(FEIC)
08/01/2005 08:00 EDT http://www.prnewswire.com

"Safe Harbor" Statement under the Private Securities Litigation Reform Act of 1995: Statements in this press release regarding FEI Company's business which are not historical facts are "forward-looking statements" that involve risks and uncertainties. For a discussion of such risks and uncertainties, which could cause actual results to differ from those contained in the forward-looking statements, see "Risk Factors" in the Company's Annual Report or Form 10-K for the most recently ended fiscal year.