WOODBURY, N.Y.--(BUSINESS WIRE)--March 27, 2006--Veeco Instruments
Inc. (Nasdaq: VECO), a leading supplier of instrumentation to the
research and nanoscience community, today announced the launch of two
new scanning probe microscope (SPM) products, the MultiMode(R) V SPM
and the Dimension(R) V SPM for a broad range of research and
industrial applications. Both products feature Veeco's next generation
high-speed, state of the art controller, the Nanoscope(TM) V, enabling
researchers to see faster molecular scale events, capture more
information in every image and work with "one-button" simplicity.
According to Jeannine Sargent, Executive Vice President, Veeco
Metrology & Instrumentation, "Throughout Veeco's history in SPM, the
Multimode and Dimension products have been our best-selling, most used
technologies and have enabled more scientific breakthroughs than any
other family of SPMs on the market today. Our next generation systems,
the MultiMode V and the Dimension V, will now take researchers to new
levels of performance and ease-of-use."
Veeco's new Easy-AFM, a key feature of these systems, offers an
intuitive, easy-to-follow graphic interface for new or infrequent SPM
users. Ms. Sargent commented, "Easy-AFM reduces the time for initial
setup and adjustment of parameters, enabling a faster path to more
sophisticated, high-quality images. We anticipate the simplicity of
these products will lead to even greater adoption of SPM technology
among scientists worldwide."
The MultiMode V, the world's highest resolution SPM, is designed
to enable measurements of small samples, such as polymers and
electrochemical materials, and the Dimension V is primarily used for
larger samples such as semiconductor wafers, data storage films and
electrical characterization applications. Both products now feature
industry-leading high-speed data capture (50MHz), increased thermal
tune capabilities and high pixel density images which allow
observation of large structures and small features in the same image.
The Nanoscope V controller captures up to eight images simultaneously.
In addition, both the MultiMode V and the Dimension V use
NanoScript(TM) open-architecture, compatible with all of the common
programming languages currently used in scientific labs worldwide.
Craig Prater, Ph.D., Veeco Fellow, added, "Both the MultiMode V
and the Dimension V were designed to be intuitive and easy-to-use in
research environments and are optimized to enable our users to
customize their nanotechnology research with new open-architecture
functionality."
The MultiMode SPM is the world's best-selling SPM. It performs the
full range of AFM and STM (scanning tunneling microscopy) techniques
to measure surface characteristics like topography, elasticity,
friction, adhesion, and magnetic/electrical fields. The short
mechanical path length between probe tip and sample enables very fast
scan rates with utmost precision. The Dimension V measures samples up
to 8 inches in diameter and has a host of innovative features that
make it an ideal system for fundamental micro- and nanoscale studies
and applied materials research; industrial product development and
quality control; and critical feature metrology, failure analysis, and
electrical characterization.
About Veeco
Veeco Instruments Inc. provides solutions for nanoscale
applications in the worldwide data storage, HB-LED/wireless,
semiconductor and scientific research markets. Our Metrology products
are used to measure at the nanoscale and our Process Equipment tools
help create nanoscale devices. Veeco's manufacturing and engineering
facilities are located in New York, New Jersey, California, Colorado,
Arizona and Minnesota. Global sales and service offices are located
throughout the United States, Europe, Japan and Asia Pacific.
Additional information on Veeco can be found at http://www.veeco.com/.
To the extent that this news release discusses expectations about
market conditions, market acceptance and future sales of Veeco's
products, Veeco's future financial performance, future disclosures, or
otherwise makes statements about the future, such statements are
forward-looking and are subject to a number of risks and uncertainties
that could cause actual results to differ materially from the
statements made. These factors include the challenges of continuing
weakness in end market conditions and the cyclical nature of the data
storage, semiconductor, HB-LED/wireless and scientific research
markets, risks associated with integrating acquired businesses and the
acceptance of new products by individual customers and by the
marketplace and other factors discussed in the Business Description
and Management's Discussion and Analysis sections of Veeco's Annual
Report on Form 10-K for the year ended December 31, 2005, subsequent
Quarterly Reports on Form 10-Q and current reports on Form 8-K. Veeco
does not undertake any obligation to update any forward-looking
statements to reflect future events or circumstances after the date of
such statements.
CONTACT: for Veeco Instruments Inc.
Investors:
Debra Wasser, 516-677-0200 x1472
or
Media:
Joan Horwitz, 805-967-1400
SOURCE: Veeco Instruments Inc.
